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ECO测试系统英文文献和中文翻译(4)

时间:2017-05-30 09:46来源:毕业论文
TEST STRATEGY PLANNER STRUCTURE to be made at several stages of the design process. It can read EDIF or Siemens specific hierarchical design descriptions. The test strategy planner contains the progra


TEST STRATEGY PLANNER STRUCTURE to be made at  several  stages of the design process.  It
can read EDIF or Siemens specific hierarchical design
descriptions.
The test strategy planner contains the programs for
the evaluation of  the cost model, as well as the evalua-
tion of  the effects of  test methods on the design. It takes
its  input  from  the design description  and  cost model
files,  and  uses  stored  knowledge on  test methods  to
evaluate a  variety of test  strategies.  Cell  library data
are  linked  to  test method descriptions.
The  test strategy control can be  left entirely to the
user,  and a  group  of functions are provided  to  apply
test  methods  and  examine  the  cost  model  and  the
testability status of the circuit. Alternatively, the user
has the option of employing one of a set of algorithms
that  perform  automatic  test  strategy planning  to  ac-
celerate  the  selection process  [11].
ECOtest  does  not  try  to  partition  the  circuit  into
testable units.  It  relies on  the  design hierarchical  in-
formation to define testable units.  Figure 3  shows an
example circuit and  the hierarchical  level  the  system
requires. This circuit will serve for demonstration pur-
poses  and be used  in  later analysis. A  range of DFT
methods, including  the no DFT option, are considered
for each block. It should be remembered that when ap-
plying a DFT method  there will always be a set of con-
straints that have to be met before the economic issues
can be considered, e.g., minimum overall fault cover-
age/area overhead. Thus ECOtest ensures that only ap-
plicable DFT methods can be  applied  to each block.
In addition, after DFT has been considered, to ensure
testability of the  circuit,  an  analysis is performed  to
check that each block is  100%  accessible from exter-
nal  pins.摘要:本文将讨论影响测试周期成本的因素,提出一个在测试每个阶段减少生命周期的方法来减少整个生命周期成本最经济的测试策略。基于由不同的测试技术选择了不同测试策略进行了详细的经济分析描述。
关键词:ECO测试系统、生命周期成本、测试方法、测试计划。
1 引言
我们将对测试电子元件经济学分析这一严肃的话题进行讨论,或者说,我们真的能够进行测试吗?幸运的是,当今的主流观点是,质量是重要的。因此我们得出测试是很有必要的。仍会有各种各样的观点是如何最好地实现这一目标,或什么级别的测试是被认为是可以满足的,但至少可以提高他们的DFT(测试设备,数据传送设备,数据传输系统)从业者们在测试领域的能力。 ECO测试系统英文文献和中文翻译(4):http://www.751com.cn/fanyi/lunwen_8050.html
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