LabVIEW荧光磁粉探伤缺陷识别图像处理系统设计

摘要磁粉探伤技术是无损检测的重要手段之一，在表面缺陷检测等领域的应用越来越广泛，是未来无损检测的发展方向。本文在充分了解荧光磁粉探伤技术的基础上，综合分析被检工件的特点以及系统需要实现的检测指标要求，确定了荧光磁粉探伤缺陷识别图像处理系统的总体方案。针对荧光磁粉的物理特性、激发和发射光谱以及光源的打光方式进行了研究，解决了由于光源引起的成像质量不高进而影响检测效果的问题。同时，详细研究了基于数字图像处理技术和LabVIEW开发平台的荧光磁粉探伤图像处理系统，给出了图像处理软件系统的整体架构及其组成模块，主要包括图像采集、图像校正、图像降噪、对比度增强和阈值分割以及缺陷识别几部分，系统界面简洁，实时性高，通用性强。最后对系统进行整体试验，实验结果表明，设计的图像处理系统可以实现样本直径0.5mm的圆形缺陷和长度1.5mm的线性缺陷的准确识别，达到了设计要求。42364

关键词荧光磁粉数字图像处理缺陷检测 LabVIEW

毕业论文设计说明书外文摘要

Title Design of image processing system for defect recognition based on fluorescent magnetic particle inspection

Abstract

Magnetic particle inspection technology is one of the important means of NDE. It is more and more widely used in the field of surface defect detection, which is the development direction of NDE in the future. Based on the comprehensive analysis of characteristics of the inspected workpiece and the detection requirements the system needs to achieve and the full investigation of the fluorescent magnetic particle detection technology, the general scheme of a fluorescence magnetic particle testing system for workpiece surface defect detecting was introduced. The physical characteristics, excitation spectra and emission spectra of the fluorescent magnetic powder and lighting methods of light source were studied in detail, which solved the problem that the image quality caused by the light source is not high affecting detection effect. At the same time, a fluorescent magnetic particle detection image processing system based on digital image processing technology and LabVIEW development platform was suggested, the software architecture and component modules of the image processing system were proposed. The system interface is simple, real-time and universal. The whole experiment was carried out on the system at last. The experimental results show that the design of the image processing system can achieve identification of the diameter of 0.5mm circular defects and length of 1.5mm linear defect, which achieved the design requirements.

Keywords Fluorescent magnetic particle Digital image processing Defect detection LabVIEW

1 绪论 1

1.1 研究的目的与意义 1

1.2 磁粉探伤技术的研究现状 1

1.3 论文的主要工作 3

2 检测系统总体方案设计 4

2.1 图像处理系统的技术指标说明 4

2.2 荧光磁粉检测的原理 4

2.3 检测系统总体方案设计 4

2.4 检测系统的硬件结构 5

2.5 检测系统的软件平台 6

3 图像采集硬件系统 LabVIEW荧光磁粉探伤缺陷识别图像处理系统设计:http://www.751com.cn/zidonghua/lunwen_42783.html