摘要本文通过模板法和高温煅烧相结合来制备掺杂氧化锌-纳米氧化铈空心球的方法。通过控制变量，分别探讨水浴温度、铈源的量、沉淀剂的量及煅烧温度四个因素对样品形貌的影响，并揭示其形成机理。采用扫描电镜（SEM），粒径分析（DLS）研究样品的微观表面和粒径大小，用X射线衍射（XRD）和傅里叶红外变换红外光谱仪（FT-IR）来探究制备样品的晶型和纯度，利用固体紫外漫反射光谱和罗丹明B溶液在的紫外光下的自降解性能来探究样品的紫外屏蔽能力。得出一些结论：1、在低掺杂条件下，氧化锌的掺杂量越大，样品的紫外屏蔽性能越好。2、制备的纳米氧化铈空心球在220 nm - 340 nm波长范围内的紫外光区有较强的吸收，而对于450 nm 以上的可见光的透过率达到100 %，是很好的紫外屏蔽材料。58105

毕业论文关键词：氧化铈；空心球；氧化锌；模板法；紫外屏蔽

 Abstract A facile preparation of ZnO-doped CeO2 nanoparticles hollow spheres was prepared by template method and calcination. Using the control variable method，we respectively investigate effects on the morphology of hollow sphere of four factors: the water bath temperature, the amount of Ce(NO3)3·6H2O, the amount of NH3·OH and the calcination temperature. And the form mechanism of ZnxCe1-xO2-x hollow spheres was analysed. SEM and DLS were adopted to investigate the surface microscopic surface and the size of ZnxCe1-xO2-x hollow sphere. X-ray diffraction (XRD) as well as Infrared Fourier Transform Infrared spectrometer (FT-IR) was used to research the crystal structure of hollow sphere and purity of samples. Self degradation property of Rh B solution under a UV light and the solid UV diffuse reflectance spectroscopy was adopted to explore the capability of UV-sheilding. Some conclusions are as follows: 1、When it was low-doped, more doped ZnO，better UV-shielding performance. 2、The obtained samples showed excellent UV absorption to ultraviolet region over 220-340 nm wavelength range and great transparency in the visible ray region with a wavelength more than 450 nm, which demonstrated it an excellent UV-sheilding material.

Key words: CeO2 ; hollow spheres; ZnO; template method; UV-shielding

目  录

第1章 绪论 5

1.1 紫外屏蔽材料发展背景 5

1.1.1 紫外线与紫外线的危害 5

1.1.2 紫外屏蔽材料分类及发展现状 5

1.1.2.1　有机类紫外屏蔽剂 6

1.1.2.2　无机类紫外屏蔽剂 7

1.2 纳米材料在紫外屏蔽领域的应用 7

1.2.1 纳米材料的特点 7

1.2.2 纳米材料在紫外屏蔽领域的应用 8

1.2.3 纳米材料的制备方法 10

1.3 本文研究内容和创新之处 11

1.3.1 研究内容 11

1.3.2 本实验优势 12

第2章 实验 13

2.1 实验方案 13

2.1.1 实验流程 13

2.1.2 原料与设备 13

2.1.3 样品制备步骤 15

2.2 样品表征方法 16

2.2.1 扫描电镜(SEM) 16

2.2.2 粒径分析（DLS） 16